Semiconductor Manufacturing

X Ray Metrology in Semiconductor Manufacturing

D. Keith Bowen and Brian K. Tanner,”X-Ray Metrology in Semiconductor Manufacturing” CRC | January 24, 2006 | ISBN: 0849339286 | 296 pages | PDF | 10.48 mb The scales involved in modern semiconductor manufacturing and microelectronics continue to plunge downward. Effective and accurate characterization of materials with thicknesses below a few nanometers can be achieved [...]

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Thursday, May 14th, 2009 Uncategorized No Comments

Semiconductor International Free Semiconductor International Newsletter Subscription

Request Your Complimentary Newsletter NOW! “Semiconductor International” Semiconductor International is the world’s leading monthly magazine written for manufacturers of semiconductors and integrated circuits. Semiconductor International is a technical/business publication covering the global semiconductor manufacturing industry. It serves the needs of semiconductor engineers and suppliers through a wide range of products and services including magazines, directories, [...]

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Wednesday, May 13th, 2009 Uncategorized No Comments

Semiconductor Manufacturing Handbook

Semiconductor Manufacturing Handbook Publisher:McGraw-Hill | Pages: 800 | 2005-04-27| ISBN 0071445595| PDF | 41 MB This handbook will provide engineers with the principles, applications, and solutions needed to design and manage semiconductor manufacturing operations. Consolidating the many complex fields of semiconductor fundamentals and manufacturing into one volume by deploying a team of world class specialists, [...]

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Wednesday, May 13th, 2009 Uncategorized No Comments

Human Friendly Mechatronics

Masaharu Takano, Tatsuo Arai, Eiji Arai, “Human Friendly Mechatronics” Publisher: Elsevier | ISBN: 0444506497 | 2001 | PDF | 400 pages | 22 Mb rared PDF ICMA (International Conference on Machine Automation) was born in Finland, who is well known to be one of the most advanced countries in the field of science and technology. [...]

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Sunday, March 29th, 2009 Uncategorized No Comments

Liquid Phase Epitaxy of Electronic Optical and Optoelectronic Materials

Peter Capper, Michael Mauk “Liquid Phase Epitaxy of Electronic, Optical and Optoelectronic Materials” Wiley-Interscience | 2007-09-17 | ISBN: 0470852909 | 464 pages | PDF | 5 MB Liquid-Phase Epitaxy (LPE) is a technique used in the bulk growth of crystals, typically in semiconductor manufacturing, whereby the crystal is grown from a rich solution of the [...]

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Sunday, February 1st, 2009 Technical No Comments

Solid State Technology – January 2009

Solid State Technology – January 2009 PDF | English | 2.60 MB | 36 pages Solid State Technology magazine is the longest-running semiconductor magazine and is the most complete source of information for the semiconductor manufacturing industry. Each issue covers the latest on semiconductor business news and products with topics such as nanotechnology, semiconductor equipment, [...]

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Thursday, January 22nd, 2009 Uncategorized No Comments

Control and Optimization of Multiscale Process Systems

Product Description: Interest in the control and optimization of multiscale process systems has been triggered by the need to achieve tight feedback control and optimal operation of complex processes, such as deposition and sputtering of thin films in semiconductor manufacturing, which are characterized by highly coupled macroscopic and microscopic phenomena. Drawing from recent advances in [...]

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Tuesday, January 6th, 2009 Technical No Comments

Scientific Wet Process Technology for Innovative LSI/FPD Manufacturing

Tadahiro Ohmi ” Scientific Wet Process Technology for Innovative LSI/FPD Manufacturing” CRC | 2005-12-21 | ISBN: 0849335434 | 400 pages | PDF | 15 MB As science pushes closer toward the atomic size scale, new challenges arise to slow the pace of the miniaturization that has transformed our society and fueled the information age. New [...]

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Saturday, January 3rd, 2009 Technical No Comments

Measurement Analysis and Control Using Jmp: Quality Techniques for Manufacturing

Measurement, Analysis, and Control Using Jmp: Quality Techniques for Manufacturing Publisher:SAS Publishing| Pages:344| 2007-08-30| ISBN 1590478851| PDF | 7 MB For a manufacturing activity to remain competitive, engineers must rigorously apply statistics methodologies that enable them to understand the sources and consequences of uncontrolled process variation. In this example-rich text, author Jack Reece explains simple [...]

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Wednesday, December 24th, 2008 Technical No Comments

Liquid Phase Epitaxy of Electronic, Optical and Optoelectronic Materials

Liquid-Phase Epitaxy (LPE) is a technique used in the bulk growth of crystals, typically in semiconductor manufacturing, whereby the crystal is grown from a rich solution of the semiconductor onto a substrate in layers, each of which is formed by supersaturation or cooling. At least 50% of growth in the optoelectronics area is currently focussed [...]

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Tuesday, November 18th, 2008 Technical No Comments
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